RAM chips consist of a large array of tightly packed memory cells, one for each bit of data. The vast majority of the intermittent failures are a result of interaction between these memory cells. Often writing a memory cell can cause one of the adjacent cells to be written with the same data. An effective memory test attempts to test for this condition.

Therefore, an ideal strategy for testing memory would be the following:
1.Write a cell with a zero.
2.Write all of the adjacent cells with a one, one or more times.
3.Check that the first cell still has a zero.

It should be obvious that this strategy requires an exact knowledge of how the memory cells are laid out on the chip. In addition there are a never ending number of possible chip layouts for different chip types and manufacturers making this strategy impractical. However, there are testing algorithms that can approximate this ideal and MemTest86 does just this.